Design and Self-Consistent Schrodinger-Poisson Model Simulation of Ultra-Thin Si-Channel Nanowire FET
نویسندگان
چکیده
Since at the regime of nanometer, quantum confinement effects are observed and wave nature electrons is more dominant. Therefore, classical approach current formulation in mesoelectonics nanoelectronics results inaccuracy as it does not consider effect, which only applicable for bulk electronic device. For accurate modeling simulation nanoelectronics, device atomic-level mechanical models required. In this work, an ultra-thin (2 nm diameter) Silicon- channel Cylindrical Nanowire FET (CNWFET) designed simulated by invoking non-equilibrium green function (NEGF) formalism self-consistent Schrodinger-Poisson’s equation model. Then impact variation temperature, oxide thickness, metal work NWFET investigated to analyze distinct performance parameters e.g. threshold voltage (Vth) drain induced barrier lowering (DIBL), sub-threshold swing (SS), ION/IOFF ratio. The exhibits reliable shows a SS 57.8 mV/decade ION IOFF ratio order 109 room temperature.
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ژورنال
عنوان ژورنال: Silicon
سال: 2021
ISSN: ['1876-9918', '1876-990X']
DOI: https://doi.org/10.1007/s12633-021-01388-7